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Some of the targets with 32K RAM seems to be failing the heap block device tests
Suggested enhancement
Can the tests be modified to use less heap on resource constrained devices?
Pros
Useful for many smaller targets with limited RAM.
Question
How to?
Is there an option to include something like "special, low memory" tests that could may be selected based on a macro (similar to that being done for SD driver tests now) and built / ran only for a few selected targets?